Probe Station (MI-WPT2)

Product Description

Features:

• Optimized for I-V, C-V measurements of device and wafer characterization tests, Failure analysis, sub- micro  probing MEMS, optoelectronics engineering test and more.
• Stable Platen mounted with up to 6 micro positioners facility.
  
• Solid station frame with built-in vibration-isolations.
  
• Option for High Resolution top side microscope.
  
• Quick and ergonomic sample change.

Specification 

• XY Theta Chuck: 1 Nos.
• Micro positioners  : 4Nos.
• Microscope  : Stereo Zoom , Microscope System With Boom Stand(1Nos)
• Probe Type RF Coaxial : 4 Nos.
• Magnetic Steel Platen : 2 Nos.
• Probe Tips : 4Nos+ 6Nos spare Needle